Computed Tomography: Principles, Design, Artifacts, and Recent Advances (SPIE Press Monograph Vol. PM114) |  | Author: Jiang Hsieh
Publisher: SPIE Publications
Buy New: $86.00
as of 3/22/2010 01:02 CDT details
New (7) Used (9) from $50.20
Seller: Amazon.com
Sales Rank: 1114665
Media: Hardcover
Pages: 387
Number Of Items: 1
Shipping Weight (lbs): 2.3
Dimensions (in): 10.3 x 7.4 x 1
ISBN: 0819444251
Dewey Decimal Number: 616.07572
EAN: 9780819444257
ASIN: 0819444251
Publication Date: February 18, 2003
Availability: Usually ships in 24 hours
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Product Description
X-ray computed tomography (CT) has experienced tremendous growth in recent years, in terms of both basic technology and new clinical applications. This book provides an overview of the evolution of CT, the mathematical and physical aspects of the technology, and the fundamentals of image reconstruction using algorithms. It examines image display from traditional methods through the most recent advancements, and it discusses key performance indices, theories behind the measurement methodologies, and different measurement phantoms in image quality. General descriptions and different categories of artifacts, their causes, and their corrections are considered at length.
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